# Difference: JetEoPCSCPlots (1 vs. 4)

#### Revision 42010-12-06 - PatrickJussel

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#### Revision 32010-05-10 - PatrickJussel

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# Jet 8 (E over P) Note

#### Revision 22009-11-24 - PatrickJussel

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#### Revision 12009-06-17 - MarkHodgkinson

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# Figures

Caption: Mean LEP energy (x = 0.95) vs jet energy for jets with |eta| < 1.5. The error bars are the FWHM of the LEJP energy spectrum. In the jet with the highest $p_T$, the lowest energy jet particles (LEJPs) are determined by ordering particles in energy. Starting with the highest energy the particle energies are summed up until the fraction x of the jet energy is reached. The particle that pushes this sum over the threshold is the LEJP.

Caption: Mean LEP energy (x = 0.95) vs jet energy for jets with 1.5 < |eta| < 3.2. The error bars are the FWHM of the LEJP energy spectrum. In the jet with the highest $p_T$, the lowest energy jet particles (LEJPs) are determined by ordering particles in energy. Starting with the highest energy the particle energies are summed up until the fraction x of the jet energy is reached. The particle that pushes this sum over the threshold is the LEJP.

Caption: $E/p$ distributions for pions from minimum bias events before cuts (dotted line), after cuts (dark solid line) and for a reference sample of single particles (dashed solid line) for tracks in the $p_T$ range 8-12 GeV

Caption: $E/p$ distributions for pions from minimum bias events before cuts (dotted line), after cuts (dark solid line) and for a reference sample of single particles (dashed solid line) for tracks in the $p_T$ range 0.8-1.22 GeV

Caption: $E/p$ distributions for pions from minimum bias events before cuts (dotted line), after cuts (dark solid line) and for a reference sample of single particles (dashed solid line) for tracks in the $p_T$ range 1.6-2.4 GeV

Caption: $E/p$ distributions for pions from minimum bias events before cuts (dotted line), after cuts (dark solid line) and for a reference sample of single particles (dashed solid line) for tracks in the $p_T$ range 4-6 GeV

Caption: The total, $(E/p)^{meas}$, (left) and underlying event, $(E/p)^{contam}$, (right) distributions used to extract the $E/p$ of isolated charged hadrons in the range 0.8 - 1.2 GeV. Error bars show the statistical error on the distribution before fitting (solid line).

Caption: $E/p$ distributions obtained from deconvolution for pions in minimum bias events (solid line) and single pions (dashed line) for the track momentum ranges 8 < $P_{T}$ < 12 GeV. The deconvolution also removes the effect of fake'' clusters in $EM_{outer{\textendash}cone}$, reconstructed from electronic noise.

Caption: $E/p$ distributions obtained from deconvolution for pions in minimum bias events (solid line) and single pions (dashed line) for the track momentum ranges 0.8 < $P_{T}$ < 1.2 GeV. The deconvolution also removes the effect of fake'' clusters in $EM_{outer{\textendash}cone}$, reconstructed from electronic noise.

Caption: $E/p$ distributions obtained from deconvolution for pions in minimum bias events (solid line) and single pions (dashed line) for the track momentum ranges 1.6 < $P_{T}$ < 2.4 GeV. The deconvolution also removes the effect of fake'' clusters in $EM_{outer{\textendash}cone}$, reconstructed from electronic noise.

Caption: $E/p$ distributions obtained from deconvolution for pions in minimum bias events (solid line) and single pions (dashed line) for the track momentum ranges 4 < $P_{T}$ < 6 GeV. The deconvolution also removes the effect of fake'' clusters in $EM_{outer{\textendash}cone}$, reconstructed from electronic noise.

Caption: The total, $(E/p)^{meas}$, (left) and underlying event, $(E/p)^{contam}$, (right) distributions used to extract the $E/p$ of isolated charged hadrons in the range 0.8 - 1.2 GeV. Error bars show the statistical error on the distribution before fitting (solid line).

Caption: $p_T$ distribution of all tracks (solid line) and selected tracks (dashed line) in minimum bias events, scaled to 1 $\mu b^{-1}$.

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