Table of Data flux in the DAQ2 for 5 types of events:
  • Calibration single event (Col. B)
  • Calibration burst [until memory full] (Col. C)
  • High Energy Test Beam single event (Col. D)
  • High Energy Test Beam burst [until memory full] (Col. E)
  • Demo mode (ILC like beam) [now same as TB burst]

The Maximum readout time is calculated (and minimal achievable frequency in continuous operation mode).
The critical acquisition line is bolded in red

Three sets of parameters are available

  • Hardware (more of less fixed)
    • ASICs memory & event size
    • Number of ASIC per partition
    • Number of partition per DIF
    • Number of concentration lines in LDA & DCC
  • DAQ (Clock speeds)
  • Physics (Occupancy for one high energy TB event) & Noise

-- VincentBoudry - 07-Apr-2010

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