DESY 2017-06 SiW ECAL "10 SLABs"
Test 10 Short SLAB's in flexible frame, at DESY.
This page is a copy of
SiWCERN201511.
It can be edited by the members of the
SiWDESY201706Group .
Organisation
Responsabilities & Contacts
Contacts admin
Vincent Boudry +33 6 7131 0577,
Coordinator:
Adrián Irles
Technical Coordinator:
Frédéric Magniette
e-group of TB-participants:
SIWECAL-BT2017@cernNOSPAMPLEASE.ch (
Management link
)
Elog
Docs
Lodging:
Planning
Talks, proceedings and papers
Articles and Proceedings Repository: https://github.com/SiWECAL-TestBeam/TB2017-doc/
Conferences
- Calice Meeting Mainz 2018
- Calice Meeting at Tokyo, September 2017:
- CHEF2017:
- LCWS 2017:
- IEEE 2017:
Harwdare status and detector configuration
Slabs
Information about the slabs is in
https://forge.in2p3.fr/projects/calice/wiki/Si-WEcalSLABS
For example, if one looks into
https://forge.in2p3.fr/projects/calice/wiki/SiWEcalSlab13
will see:
sU_4b_11_F_#13
FEV11 n°33
SMBV4b n°11
Then, the PCB n° 33, corresponds to the row 5 of the table table, and the wafers Wafers n° 10 13 15 14
There is also an ASU table (PCB+Wafer)
https://forge.in2p3.fr/projects/calice/wiki/Si-WEcalASU
Settings
Spill settings: 5Hz, 3.7ms width: 0.9 (start acq) + 0.5 (val evt) + 2.3 ms (real spill)
Trigger thresholds: >230 for all chips (set in the commissioning procedure). Choice done chip-wise.
Standard acquisition: 30 minutes per point.
Some re-masking of single channels has been done during the calibration. The final
xml configuration file is used for all the other runs (showers, angle, magnet) with no further changes.
- SETUP:
The slab ordering shown above was kept unchanged for all the testbeam except at the end, when the first layer was moved out from the begining of the detector to the other beam area, TB24/2 with the PCMag.
Summary of masked channels: Total # of channels not masked --> 6204 (87%)
Layer 1, Slab 21 → 43.4% (one wafer)
Layer 2 – 6 , slabs 16,-20 ~6-8%
Layer 7, slab 22, ~ 16% (one chip)
5% are masked manually just before starting the commissioning → same patter in all slabs:
Chn 37 in all chips,
Chn 41-53, chips 1,9
Chn 5, chips 0 and 8
Chn 3, 9, 10, chip 7 and 15
The trigger threshold were set chip-wise as the maximum of the scurve threshold + 5 sigmas or 225 DAC.
Physics program
The data taking program consisted in the MIP calibration using 3GeV positrons, the shower using different energy positrons and different width of tungnsten between the slabs, a mip run with the detector in an angle of ~45 degrees with respect the beam and a set of runs of single slab (21) inside the magnetic field.
Shower Program
Magnetic field tests
MIPs at 45 degress
Check the pageabove for analysis tools and the dedicated BT analysis internal meetings:
https://indico.in2p3.fr/category/652/
--
VincentBoudry - 2017-06