In parallel to the magnetic field tests and setup, we decided to take a run with the detector tilted ~45 degrees to increase the cross section of the silicon wafer traversed by MIP-acting electrons. You can see the diagram of the new position in the attachement. We kept all layers inside the stack except the first one (slab 21) moved to the magnetic field area.

-- AdrianIrles - 2017-10-10

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PNGpng diagram_45degrees.png r1 manage 5517.4 K 2017-10-10 - 16:29 AdrianIrles  

This topic: CALICE > WebHome > SiWEcal > SiWBeamTest > SiWTechTests > SiWDESY201706 > SiWDESY201706MIP45
Topic revision: r1 - 2017-10-10 - AdrianIrles
 
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