Lab testing procedure (CLICpix+CCPDv3)

For all work with the clicpix + hv-cmos assemblies, care should be taken not to turn on the FPGA board directly after turning it off. Doing so will cause the chip to burn like an LED and self-destruct. This is not a joke.

To set up the system from scratch, navigate to the folder /home/pixel/uASIC/software/trunk and source the setup script env.sh. Make sure that control hub is running by running the start command: sudo /opt/cactus/bin/controlhub_start. To start up the hardware, connect the FPGA via ethernet cable to the computer, and make sure that the computer port IP is set to 192.168.200.1. Then turn on the FPGA and check (after a few seconds) that it responds by pinging it at 192.168.200.16.

Quick electrical test (CLICpix+CCPDv3)

The first test of the assembly should be to make sure there are no shorts on the PCB/bond wires. This is performed as follows:

  • Plug the assembly into the interface board (while the FPGA is powered off)
  • Turn on the FPGA and make sure that you can ping it
  • Run the script ccpd_test.py
The script will set the voltage regulator output and read back the voltages and currents. Check that the voltage is correctly set, and look at the currents. In general if these reach 100-200 mA then turn off the system quickly! If testing a system for the first time, look and record the current values on DACs 3, 4 and 5, saving the results in CurrentsHVCMOS.txt.

IV Measurement (all types of assemblies)

The next check is to make sure that there is no problem with the high voltage. In the lab there is a keithley which can be connected to the computer via ethernet cable. Check the IP on the keithley and put this value into the script iv.py. To perform the measurement:

  • Plug the high voltage into the LEMO connector on the interface board (if in doubt, ask!)
  • Cover the sensor with foam/something to prevent light from falling on the sensor
  • Run the script iv.py to record the IV curve
  • Turn off the high voltage
  • The output data is stored by default in /storage/pixel/data/hvcmos_iv/"current time and date" - rename this to the assembly name
  • Plot the IV curve using the script /storage/pixel/data/hvcmos_iv/plotIV.gnu, after changing the title, input path and output path
  • Upload the IV curve to the table below
The CCPDv3 sensor should show a sharp increase in current at 93 V, but in general should be lower than approximately 50 nA.

CLICpix test

This is the first test to check the response of the CLICpix and to see that it is operational/usable. It consists of two steps: threshold equalisation of the pixel matrix and a threshold scan. This threshold scan can be used to determine the operating point of the device. To perform the test:

  • Bias the HV-CMOS to -60 V (making sure that the sensor is dark)
  • Run the script clicpix_eqalize.py with options "-e -s -n" (equalise, threshold scan, negative polarity)
  • Turn off the high voltage
  • The threshold scan plots, ScanActivePixels.png and ScanPixelCount.png, should be output by default to /home/pixel/uASIC/software/trunk/data/BOARD_ID/equalization/DATA_AND_TIME - upload to the table below

HV-CMOS (CCPDv3) test

Now that the CLICpix is responding, the final check is that the HV-CMOS is also working. An indication of this should be given by the electrical tests above - the current consumption for DAC 3 should be of order 45 mA. Before taking any data, the operating threshold of the CLICpix must be determined. This can be done by looking at the threshold scan plots from the previous test - pick a value of the threshold for which the number of pixels responding is small (order 40-50). This should be approximately 120 DAC steps from the equalisation mean. Then:

  • Edit the script radsource.py to include the threshold for this device
  • Turn on the high voltage
  • Without a source on top run the radsource.py script and observe the number of counts per frame. If this is >> 200 then reduce the threshold DAC and try again
  • Once the threshold doesn't produce too many noise hits, take data by running radsource.py with argument "WithoutSource". This will produce the output file frames/chipIDXXX.
Now the test should be performed again with a source on top of the HV-CMOS. Take the Sr90 source from the safe (remembering to display the source card next to the setup)

  • Place the source on top of the HV-CMOS
  • Run the script radsource.py with argument "WithSource" and observe the number of counts (should be noticeably higher)
It is possible that on the first attempt the source will not be completely aligned with the sensor. In this case, repeat the measurement while moving the source until you find the maximum number of counts. Then take one set of data without moving the source further.

CLICTD Tests

Bias voltages are applied to the p-wells and the substrate of CLICTD. There are two possibilities to apply the voltage:

  • Directly on the PCB: allows the p-well and substrate to be biased individually. To use this mode, place the two red jumpers at the second row (closer to the margin of the board) such that the central pin is not covered.
  • From the CarBoard: the same bias voltage is applied to p-well and substrate. To use this mode, place one jumper on the second row such that the central pin and one neighbour (either left or right) is covered. The second jumper is placed on the first row such that the central pin and the neighbouring pin are covered (if left neighbour in second row is covered, right neighbour in first row need to be covered and vice versa).

Assembly results

Type Assembly Board ID Description Status Tests performed IV plot Threshold scan counts plot Threshold scan pixels plot Comments
CCPDv3 SET9 001ec0db94b1 Ideal alignment Alive in lab Electrical, IV, CLICpix IV curve Threshold scan Threshold scan Tested in beam
CCPDv3 SET10 001ec0db2e5e Quarter pixel misalignment Alive in lab Electrical, IV, CLICpix IV curve Threshold scan Threshold scan Tested in beam
CCPDv3 SET11 001ec0dafabc Half pixel misalignment Unresponsive (?) in lab Electrical, IV, CLICpix IV curve Threshold scan Threshold scan Saw beam but doesn't show many hits
CCPDv3 SET12 001ec0dbabb9 Ideal alignment, thicker glue Alive in lab Electrical, IV, CLICpix IV curve Threshold scan Threshold scan Tested in beam
CCPDv3 SET13 001ec0db2082 Ideal alignment Alive in beam area Electrical, IV, CLICpix IV curve Threshold scan Threshold scan Being tested in beam
CCPDv3 SET14 001ec0db5bfb Half pixel misalignment Alive in lab Electrical, IV, CLICpix IV curve Threshold scan Threshold scan Tested in beam
CCPDv3 SET15 001ec0db5ca6 Ideal alignment, thicker glue Alive in lab Electrical, IV, CLICpix IV curve Threshold scan Threshold scan Tested in beam
CCPDv3 SET16 001ec0db5ca6 Half pixel misalignment Alive in lab Electrical, IV, CLICpix IV curve Threshold scan Threshold scan New sample, not tested in beam
CLICTD A1 - Modified process with continuous n-type implant Alive in lab IV, Equalisation, Source and xray measurements - - - Tested in DESY testbeam, Wafer W5
CLICTD A2 - Modified process with continuous n-type implant Broken Equalisation, xray measurements - - - Wafer W5
CLICTD A3 - Modified process with continuous n-type implant Broken - - - - Wafer W5
CLICTD A4 - Modified process with continuous n-type implant Alive in lab Equalisation - - - Wafer W5, PCB with cut-out, Tested in DESY testbeam
CLICTD A5 - Modified process with continuous n-type implant Broken - - - Equalisation, IV Wafer W5, thinned down to 100 um
CLICTD A6 - Modified process with continuous n-type implant Alive in lab - - - Equalisation, IV Wafer W5, thinned down to 50 um
CLICTD A7 - Modified process with continuous n-type implant Alive in lab - - - Equalisation, IV Wafer W5, thinned down to 100 um
CLICTD A8 - Modified process with continuous n-type implant Broken - - - IV Wafer W5, thinned down to 40 um
CLICTD A9 - Modified process with continuous n-type implant Alive in lab - - - IV, Equalisation Wafer W5, thinned down to 40 um, Bias only until -3.8 at p-wells
CLICTD A10 - Modified process with continuous n-type implant Alive in lab - - - IV, Equalisation Wafer W5, thinned down to 40 um
CLICTD B1 - Modified process with gap in n-type implant Broken IV, Equalisation, Source and xray measurements - - - Tested in DESY testbeam, Wafer W4
CLICTD B2 - Modified process with gap in n-type implant Alive in lab Equalisation, xray measurements - - - Wafer W4
CLICTD B3 - Modified process with gap in n-type implant Broken - - - - Wafer W4
CLICTD B4 - Modified process with gap in n-type implant Alive in lab Equalisation - - Equalisation Wafer W4, Tested in DESY testbeam, PCB with cut-out
CLICTD B5 - Modified process with gap in n-type implant Alive in lab - - - Equalisation,IV Wafer W4, thinned down to 100 um
CLICTD B6 - Modified process with gap in n-type implant Alive in lab - - - Equalisation,IV Wafer W4, thinned down to 50 um
CLICTD B7 - Modified process with gap in n-type implant Alive in lab - - - Equalisation,IV Wafer W4, thinned down to 50 um
CLICTD B9 - Modified process with gap in n-type implant Alive in lab - - - IV, Equalisation Wafer W4, thinned down to 40 um, one row not responsive
CLICTD B10 - Modified process with gap in n-type implant Alive in lab - - - IV, Equalisation Wafer W4, thinned down to 40 um
CLICTD W18_1 - Cz / high dose / extra p-well Alive in lab - - - IV, Equalisation Wafer W18, thickness 100 um
CLICTD W15_1 - Cz / intermediate dose / gap physically damaged / scratch - - - IV Wafer W15, thickness 100 um
CLICTD W8_1 - Epi / low dose / extra p-well IV good, no configuration - - - IV Wafer W8, thickness ??? um
CLICpix+planar 43 W 001ec0da56b4 worst planar sensor Alive in lab Electrical, IV, CLICpix IV curve Threshold scan Threshold scan Tested in beam, many pixels show no hits during equalisation
CLICpix+planar 14 ok 001ec0da4e0d ok planar sensor Alive in lab Electrical, IV, CLICpix IV curve Threshold scan Threshold scan Not tested in beam, cannot take voltage anymore, 16 pixels show no hits during equalisation
CLICpix+planar 31 best 001ec0da578c best planar sensor Alive in lab Electrical, IV, CLICpix IV curve Threshold scan Threshold scan Tested in beam, 9 pixels show no hits during equalisation
CLICpix+planar 50um-4 001ec0dacbb6 Active edge 50um thick Alive in lab Electrical, IV, CLICpix IV Curve Threshold scan Threshold scan New sample, not tested in beam
CLICpix+planar 150um-6 001ec0dab10e Active edge 150um thick Alive in lab Electrical, IV, CLICpix IV Curve Threshold scan Threshold scan New sample, not tested in beam
CLICpix2+planar 11-FBK398-1 (assembly 14)   FBK act. edge 130 um thick, n-in-p Alive, nominal threshold = 1250 , nominal bias = -60V, baseline from lab equalisation = 1200 , half of matrix unconnected equalised, TP, source meas., test-beam data taken at SPS IV Curve     x-ray Pixel categorisation
CLICpix2+planar 9-ADV100-4 (assembly 9)   Advacam act. edge 100 um thick, GR GND, n-in-p Alive, bonding problems found   IV Curve     x-ray
CLICpix2+planar 15-ADV150-9 (assembly 15)   Advacam act. edge 150 um thick, GR GND, n-in-p Alive, bonding problems found   IV Curve     x-ray
CLICpix2+planar 3-FBK398-2 (assembly 16)   FBK act. edge 130 um thick, n-in-p Alive, nominal threshold = 1190, nominal bias = -60V, baseline from lab equalisation = 1148 equalised, TP, source meas., test-beam data taken at SPS IV Curve     x-ray Pixel categorisation
CLICpix2+planar ADV-S5 (assembly 18)   Advacam act. edge 100 um thick, no GR, Ni/Au UBM, n-in-p Unresponsive after bias applied, thought to be because of the ASIC damage   IV Curve     x-ray-0 x-ray-1 chipped corner of CLICpix2
CLICpix2+planar FBK398-3 (assembly 19)   FBK act. edge 130 um thick, n-in-p Alive, nominal threshold = 1190, nominal bias = -60V, baseline from lab equalisation = 1111 equalised, TP, source meas., test-beam data taken at DESY IV Curve     x-ray-0 x-ray-1 Pixel categorisation
CLICpix2+planar FBK398-4 (assembly 20)   FBK act. edge 130 um thick, n-in-p Alive, nominal threshold = 1290, nominal bias = -60V, baseline from lab equlaisation = 1243 equalised, TP, source meas., test-beam data taken at DESY IV Curve     x-ray-0 x-ray-1 Pixel categorisation
CLICpix2+planar ADV-S3 (assembly 21)   Advacam 100 um thick, Ni/Au Alive in lab, nominal bias -50V, nominal threshold 1285, baseline in lab equalisation = 1184. Large short region discovered in centre and at one edge of the pixel matrix (see pixel categorisation plot). configured, IV scan, equalised, source measurement, TP measurement, categorisation IV CurveIV Curve (new)     bumped ASIC x-ray Pixel categorisation
CLICpix2+planar ADV-S2 (assembly 22)   Advacam 50 um thick, Pt Can be configured but draws high current. Can be operated up to -1.8V before hitting current limit of 100uA. Operational voltage of -0.4V with 146 masked pixels for low noise at a threshold of 1335 (current ~20uA), baseline from lab equalisation = 1183. Could only be equlaised with no bias applied. Fragile. configured, equalised at 0V only, IV scan, test pulsing, response to source in noise level therefore cannot be seen. Going to DESY test beam. IV Curve (powered) IV Curve (unpowered) IV Curve (forward bias)     bumped ASIC x-ray testpulse_pulsedhitmap testpulse_unexpectedhitmap

-- DominikDannheim - 2018-04-05

Topic attachments
I Attachment History Action Size Date Who Comment
PDFpdf 2019-04-08_CLICPIX2_2x_remaining_ROCs_copy.pdf r1 manage 1999.9 K 2019-06-19 - 10:19 DominikDannheim microscope pictures of ASICs used for assemblies 21 and 22
JPEGjpg ADV-55_00.jpg r1 manage 2297.6 K 2018-12-12 - 15:17 DominikDannheim x-ray pictures of IZM CLICpix2 planar assemblies
JPEGjpg ADV-55_01.jpg r1 manage 2154.2 K 2018-12-12 - 15:17 DominikDannheim x-ray pictures of IZM CLICpix2 planar assemblies
JPEGjpg ADV-S2_50_Pt_Restchip1__ROC_unten.jpg r1 manage 842.4 K 2019-06-18 - 11:45 DominikDannheim x-ray pictures of IZM CLICpix2 assemblies
JPEGjpg ADV-S3_100_NiAu_Restchip2_.jpg r1 manage 758.5 K 2019-06-18 - 11:45 DominikDannheim x-ray pictures of IZM CLICpix2 assemblies
JPEGjpg CLICpix_Sensor-100-4_ROC_9_129x128.jpg r1 manage 776.1 K 2018-04-06 - 09:09 DominikDannheim x-ray picture of assembly 9-ADV100-4
JPEGjpg CLICpix_Sensor-150-9_ROC_15_129x128.jpg r1 manage 759.8 K 2018-04-06 - 09:06 DominikDannheim xray picture of assembly 15-ADV150-9
JPEGjpg CLICpix_Sensor-398-2_ROC_3_129x128.jpg r1 manage 798.6 K 2018-05-08 - 09:48 DominikDannheim x-ray picture of assembly 9-FBK398-2
JPEGjpg CLICpix_Sensor_398-1_ROC_11_129x128.jpg r1 manage 888.0 K 2018-04-06 - 09:09 DominikDannheim x-ray picture of assembly 11-FBK398-1
JPEGjpg FBK-398-3_00.jpg r1 manage 2148.9 K 2018-12-12 - 15:17 DominikDannheim x-ray pictures of IZM CLICpix2 planar assemblies
JPEGjpg FBK-398-3_01.jpg r1 manage 2112.9 K 2018-12-12 - 15:17 DominikDannheim x-ray pictures of IZM CLICpix2 planar assemblies
JPEGjpg FBK-398-4_00.jpg r1 manage 2111.9 K 2018-12-12 - 15:17 DominikDannheim x-ray pictures of IZM CLICpix2 planar assemblies
JPEGjpg FBK-398-4_01.jpg r1 manage 2097.2 K 2018-12-12 - 15:17 DominikDannheim x-ray pictures of IZM CLICpix2 planar assemblies
PNGpng IV_curve_CPX2_as19.png r1 manage 18.2 K 2019-05-06 - 15:51 MoragWilliams Adding IV curves for CLICpix2 assemblies 18, 19, 20
PDFpdf IV_curve_CPX2_as21.pdf r1 manage 14.3 K 2019-05-31 - 14:36 JensKroeger1  
PDFpdf IV_curve_CPX2_as21_new.pdf r1 manage 13.9 K 2019-06-18 - 18:03 SaraRuizDaza1  
PDFpdf IV_curve_CPX2_as22.pdf r1 manage 13.6 K 2019-05-31 - 14:20 JensKroeger1  
PDFpdf IV_curve_CPX2_as22_forward.pdf r1 manage 13.2 K 2019-06-18 - 18:07 SaraRuizDaza1  
PDFpdf IV_curve_CPX2_as22_powered.pdf r1 manage 13.1 K 2019-06-18 - 18:07 SaraRuizDaza1  
PDFpdf IV_curve_CPX2_as22_unpowered.pdf r1 manage 13.1 K 2019-06-18 - 18:07 SaraRuizDaza1  
PNGpng IVcurve_CLICpix2_as18_zoomin.png r1 manage 13.5 K 2019-05-06 - 15:51 MoragWilliams Adding IV curves for CLICpix2 assemblies 18, 19, 20
PNGpng IVcurve_CLICpix2_as20.png r1 manage 13.2 K 2019-05-06 - 15:51 MoragWilliams Adding IV curves for CLICpix2 assemblies 18, 19, 20
PDFpdf catagories_as14_recoloured.pdf r2 r1 manage 68.9 K 2019-06-21 - 13:34 MoragWilliams  
PDFpdf catagories_as16_recoloured.pdf r2 r1 manage 68.7 K 2019-06-21 - 13:38 MoragWilliams  
PDFpdf catagories_as19_recoloured.pdf r2 r1 manage 73.8 K 2019-06-21 - 13:43 MoragWilliams  
PDFpdf catagories_as20_recoloured.pdf r2 r1 manage 68.0 K 2019-06-21 - 13:44 MoragWilliams  
PDFpdf categorisation_as21_recoloured.pdf r1 manage 75.0 K 2019-06-21 - 13:57 MoragWilliams  
JPEGjpg clicpix2_adv.jpg r1 manage 103.3 K 2018-12-12 - 16:08 DominikDannheim CLICpix2 + Adv55
PDFpdf hitMap_planar14ok_50V_100000frames.pdf r1 manage 32.5 K 2015-08-24 - 13:43 MatthewDanielBuckland  
PDFpdf hitMap_planar31best_50V_100000frames.pdf r1 manage 32.4 K 2015-08-24 - 13:43 MatthewDanielBuckland  
PDFpdf hitMap_planar43w_50V_100000frames.pdf r1 manage 31.9 K 2015-08-24 - 13:43 MatthewDanielBuckland  
PNGpng iv_CLICpix2_planar_11.png r2 r1 manage 75.8 K 2018-04-06 - 11:14 DominikDannheim IV curve CLICpix2 planar sensor assembly 11-FBK398-1
PNGpng iv_CLICpix2_planar_15.png r2 r1 manage 76.7 K 2018-04-06 - 11:17 DominikDannheim IV curve for CLICpix2 planar sensor assembly 15-ADV150-9
PNGpng iv_CLICpix2_planar_3.png r1 manage 23.2 K 2018-05-15 - 15:40 IraklisKremastiotis IV curve CLICpix2 planar sensor assembly 3-FBK398-2
PNGpng iv_CLICpix2_planar_9.png r2 r1 manage 76.6 K 2018-04-06 - 11:16 DominikDannheim IV curve for CLICpix2 planar sensor assembly 9-ADV100-4
JPEGjpg izm_goodbumps_1.jpg r1 manage 360.6 K 2020-12-15 - 13:37 MoragWilliams Bump-bond cross section of CLICpix2 planar sensor assembly
JPEGjpg izm_goodbumps_2.jpg r1 manage 338.4 K 2020-12-15 - 13:37 MoragWilliams Bump-bond cross section of CLICpix2 planar sensor assembly
PDFpdf testpulse_pulsedhitmap_as22.pdf r1 manage 65.4 K 2019-06-19 - 11:06 MoragWilliams Pixel categorisation matrix for CLICpix2 + planar sensor assemblies, test pulsing maps for assembly 22
PDFpdf testpulse_unexpectedhitmap_as22.pdf r1 manage 14.7 K 2019-06-19 - 11:06 MoragWilliams Pixel categorisation matrix for CLICpix2 + planar sensor assemblies, test pulsing maps for assembly 22
PDFpdf velopix1-3126-5-200um-n-in-p.pdf r1 manage 121.0 K 2015-08-17 - 16:45 DominikDannheim CV on Velopix Micron wafer 3126-5
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