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Powering Tests Sector 78 - Report 07/07/2007

Test Report of Thursday 07/06/2007

  • RQ6.R7:
    • PIC2 tests were blocked due to a damaged electronic card in the QPS controller which affected the creation of Post-Mortem data and the proper generation of interlock signals. The problem is understood now and the card changed. PIC2 will be completed today after the evening meeting.

  • RD2.L8:
    • The circuit was powered and the heater discharged at 200 A in order to check the new instrumentation implemented by AT/MEL. The system still needs some hardware work. The protection system is working properly. RD2.L8 stays blocked till Monday since priority is given to RQ6.
    • Antonio Perin presented the non-conformity in the internal cabling of the RD2 and RQ4 circuits in the DFBMA.L2 and DFBMA.L8 which may be the cause of the triple quench event of last week in the matching section.

  • RQ5.L8 and RQ4.L8
    • Liberated now for further powering after the Powering Subsector OFF functionality has been disabled in the ML8 powering subsector.
    • SPA from PIC in RQ4.L8 at nominal current: Test OK
    • SPA from PIC in RQ5.L8 at nominal current: Test OK

  • 80-120A correctors in Q4 and Q5:
    • Ramped all together after the meeting at nominal current and kept there for a couple of hours.

  • ElQA
    • MBB line to be retested with all the instrumentation connected.
    • MBA line: the test with the cryogening system and one QPS rack disconnected could not start today since the boiling test in the DFBAN is taking longer than expected. If the test fails, it will be repeated with 50% of the QPS racks in the MBB line (38 units) disconnected. If the test is still failing, all the QPS racks will be disconnected.

Planning for Friday 08/06/2007

  • RQ6.R7B1 and RQ6.R7B2
    • PCS.1-PCS.4 tests (Sinus at +/-10A, energy discharge at 50, 100 and 200A) from the CCC
    • Upgrade of the controller software after the test.

  • RQ4.L8 and RQ5.L8
    • Squeezing tests if possible.

  • 80-120A correctors Q4 and Q5:
    • PNO.4 test in battery for the seven circuits available.

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Topic revision: r2 - 2007-06-08 - AntonioVergara
 
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