FakeBackgroundEstimate
This page summarizes studies related to Fake Background Estimate.
Fake Factor
Trigger and Object Definition
Electron Trigger
- e5_etcut is for Denominator only, while e5_medium1 is for Numerator.
Muon Trigger
- always use only "mu15" with away-side jet requirement
Electron
ID Electron |
Fake Electron |
Apply electron energy smearing |
same |
Author 1 or 3 (egamma) |
same |
Pt(cluster) > 15 GeV |
same |
abs(η(cluster)) < 2.47 and exclude crack region 1.37 < abs(η(cluster)) < 1.52 |
same |
OTX cleaning cut |
same |
Tight++ |
! Medium++ |
fabs(z0sin w.r.t. PV) < 0.4 mm |
same |
Impact parameter significance (d0sig) < 3 |
same |
TopoEtcone30Corr/Et < 0.16 |
TopoEtcone30Corr / Et < 0.30 |
ptcone30/Et < 0.12 (Et > 25 GeV : 0.16) |
ptcone30 / Et < 0.16 |
Muon
ID Muon |
Fake Muon |
Apply muon pT smearing |
same |
Staco combined muon |
same |
mu_staco_pt > 15 GeV |
same |
fabs(mu_staco_eta) < 2.5 |
same |
MCP ID selection |
same |
abs(z0 w.r.t. PV) < 1 mm |
same |
Impact parameter significance (d0 sig) < 3 |
no cut |
Etcone30Corr/pt < 0.20 && Etcone30Corr/pt < ((0.014*pTCB_smeared)-0.15) |
Etcone30Corr/pt < 0.30 |
ptcone30/pt < 0.1 && ((0.01*pTCB_smeared)-0.105) |
no cut |
Overlap Removal (ID lepton)
mu/e |
Delta R(e-mu) < 0.1 --> Keep muon, remove electron |
e/e |
Delta R(e-e) < 0.1 --> Keep higher pt electron |
e/jet |
Delta R(e-jet) < 0.3 ---> Keep electron, remove jet |
mu/jet |
Delta R(e-jet) < 0.3 ---> Keep jet, remove muon |
Overlap Removal (Fake lepton)
mu/e |
Delta R(e-mu) < 0.1 --> Keep muon, remove electron |
e/e |
Delta R(e-e) < 0.1 --> Keep higher pt electron |
e/jet |
Delta R(e-jet) < 0.3 ---> Keep electron, remove jet |
mu/jet |
Delta R(e-jet) < 0.3 ---> Keep muon, remove jet |
Plots
Systematics on Fake Factor
EW contamination
Pile-Up Dependence
Sample Dependence (MC closure)
W+jets CR
Same Sign Validation
New recommendations for photon identification and calibration have been released by the E/gamma combined performance group. For all the details please refer to the message sent by the E/gamma conveners (
here
). The main points to consider are the following :
- Photon Identification :
- For 2011 analyses : as described here.
- For 2012 analyses : for the cut based selection have been made available : see here.
- Code : use
egammaAnalysisUtils-00-04-19
from here
Contact - Keisuke Yoshihara (
Keisuke.Yoshihara@cernNOSPAMPLEASE.ch)