Influence of Surface Damage and Bulk Defects on the Interstrip Isolation of p-type Silicon Strip Sensors

General information

  • Contact person: Jan-Ole Müller-Gosewisch
  • Author list: Jan-Ole Mueller-Gosewisch, Alexander Dierlamm, Andreas Nuernberg
  • Reviewers: Doris Eckstein, Panja Luukka (chair), Anna Macchiolo, Katja Klein (ex-officio)
  • Public as CMS NOTE-2021/002
  • Published in JINST as 2021 JINST 16 P07004

First version of the draft

  • First version of draft, as received on 11th of November 2020: pdf

Comments to the first version of the draft

  • Comments by Katja, 11.12.2020: pdf
  • Comments by Panja, 18.12.2020: pdf
  • Comments by Anna, 22.12.2020: pdf
  • Comments by Doris, 22.12.2020: pdf

Second version of the draft

  • Second version of draft, as received on 22nd of January 2021: pdf

Comments to the second version of the draft

  • Comments by Katja, 02.02.2021: pdf
  • Comments by Anna, 08.02.2021: pdf

Third version of the draft

  • Third version of draft, as received on 18th of February 2021: pdf

KatjaKlein - 2021-07-16

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Topic revision: r19 - 2021-07-16 - KatjaKlein
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